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Technical library

The Megger technical library provides access to a range of additional content and resources such as technical guides, application notes and more. Use the filters to browse specific content (e.g. application notes) or refine your search to a particular electrical application area. 

 

If you would like to see the content we have available on a particular subject or need to locate some software, simply enter a search below. Please note, you will need to create an account to access some resources.

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    Showing item(s) 1 - 10 of 19 in total
Offline PD diagnostics using several excitation voltages
Diagnostics on both MV and HV cables is used as part of commissioning tests to check the quality of workmanship of newly installed cables and accessories. This paper goes into detail to all available excitation voltages for offline PD diagnostics.
Published: 1 June 2017
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Best practices for offline diagnosis of medium voltage cables
The continuously increasing installation complexity for medium voltage power cables, results in many weak spots and therewith cable failures due to bad workmanship. This is mainly caused by the large variety of cable accessories as well as the reduction in insulation thickness and therewith in the margin of error throughout the entire cable installation process. The necessity for both commissioning testing of new cables as well as diagnostic measurements as part of a condition based maintenance is just a logical given fact. Nowadays cable testing as well as condition monitoring are well proven measurement methods for MV power cables which are guided by IEEE 400 [1] and IEC 60502-2 [2] standards.
Published: 1 June 2017
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UHF PD-Diagnosis at high voltage cable terminations – International case studies
Different partial discharge defects show a different distribution in the frequency spectrum. These typical characteristics could be used in combination with the appropriate phase resolved partial discharge pattern for the analysis of partial discharge defects. The classification of the partial discharges allows an assessment of the defects in terms of its criticality.
Published: 1 June 2017
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Individual temperature correction (ITC) for insulation resistance measurements
The value of insulation resistance (IR) is strongly affected by the temperature of the material. However, in most cases IR measurements are done at the operating temperature of the given device. For this reason temperature correction is required to ensure that meaningful conclusions can be drawn from the measured values of IR
Published: 31 May 2017
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Transformer testing techniques and standard development
Review of IEEE, CIGRE and IEC standards for power transformer testing including overview of various frequency response analysis (FRA) techniques.
Published: 21 February 2017
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The characteristics of insulation resistance
During recent years a great deal of valuable research work has been done to increase our knowledge of the properties of insulating materials, yet notwithstanding the progress so made the natural laws governing insulation resistance are but little understood.
Published: 21 February 2017
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PowerOn TTSC June 2014
Improved transformer insulation assessment using dielectric response analysis.
Published: 21 February 2017
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On-site testing of special transformers
The increased usage of the phase shifting transformers in various fields within power systems has introduced new challenges in performing on-site maintenance testing.
Published: 21 February 2017
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Modern ART (Accuracy in Resistance Testing)
This paper will demonstrate the advantages of applying a variable low frequency AC waveform and, using temperature-to-frequency conversion techniques developed, and also the ability to correct any resistance value automatically to a to a known temperature corrected result.
Published: 21 February 2017
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Investigations on a combined resonance/VLF HV test system – partial discharge (PD) characteristics at VLF and DAC voltages
The necessity of HV cable testing is a given fact. So far, two testing methods, 24 hour soak or resonance testing are commonly used. This paper describes a comparison of test power demand dependent from voltage shape and test capacitance as well as the power consumption of test systems for different test techniques.
Published: 21 February 2017
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